Lineshape, linewidth and spectral density of parametric x-radiation at low electron energy in diamond
作者:
J. Freudenberger,
H. Genz,
V. V. Morokhovskii,
A. Richter,
V. L. Morokhovskii,
U. Nething,
R. Zahn,
J. P. F. Sellschop,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 2
页码: 267-269
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118359
出版商: AIP
数据来源: AIP
摘要:
Applying an absorber technique, the experimental shape and width of a parametric x-radiation line has been determined. The 9 keV radiation was produced by bombarding a diamond crystal of 55 &mgr;m thickness with electrons of 6.8 MeV. The variance of the spectral line distribution was found to depend on the tilt angle of the crystal and to have a magnitude of &sgr;=51 eV. Simulations based on a Monte Carlo method exhibit that the observed variance is mainly influenced by multiple scattering of electrons passing through the crystal (≈43 eV) and the finite detector opening (≈18 eV), leaving for the intrinsic linewidth a value of the order of 1 eV. The spectral density of the line was found to beJ≈10−7photons/(electron×sr×eV). ©1997 American Institute of Physics.
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