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Lineshape, linewidth and spectral density of parametric x-radiation at low electron energy in diamond

 

作者: J. Freudenberger,   H. Genz,   V. V. Morokhovskii,   A. Richter,   V. L. Morokhovskii,   U. Nething,   R. Zahn,   J. P. F. Sellschop,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 2  

页码: 267-269

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118359

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Applying an absorber technique, the experimental shape and width of a parametric x-radiation line has been determined. The 9 keV radiation was produced by bombarding a diamond crystal of 55 &mgr;m thickness with electrons of 6.8 MeV. The variance of the spectral line distribution was found to depend on the tilt angle of the crystal and to have a magnitude of &sgr;=51 eV. Simulations based on a Monte Carlo method exhibit that the observed variance is mainly influenced by multiple scattering of electrons passing through the crystal (≈43 eV) and the finite detector opening (≈18 eV), leaving for the intrinsic linewidth a value of the order of 1 eV. The spectral density of the line was found to beJ≈10−7photons/(electron×sr×eV). ©1997 American Institute of Physics.

 

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