首页   按字顺浏览 期刊浏览 卷期浏览 Chemical microanalysis by x‐ray microscopy near absorption edge with synchrotron...
Chemical microanalysis by x‐ray microscopy near absorption edge with synchrotron radiation

 

作者: F. Polack,   S. Lowenthal,   Y. Petroff,   Y. Farge,  

 

期刊: Applied Physics Letters  （AIP Available online 1977）
卷期: Volume 31, issue 11  

页码: 785-787

 

ISSN:0003-6951

 

年代: 1977

 

DOI:10.1063/1.89519

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The use of synchrotron radiation is shown to give promising properties to x‐ray absorption microanalysis. Geological samples, 30 &mgr;m thick, have been analyzed over large areas with a few micrometers resolution, and maps of transition‐metal distributions were obtained in less than 15 min. An increased resolution is expected with x‐ray resists.

 

点击下载:  PDF (197KB)



返 回