Raman and infrared spectroscopy of ferroelectric Pb(Ti0.48Zr0.52)O3films deposited by pulsed laser ablation
作者:
V. A. Yakovlev,
G. Mattei,
A. Iembo,
F. Fuso,
E. Arimondo,
M. Allegrini,
F. Leccabue,
B. E. Watts,
期刊:
Journal of Applied Physics
(AIP Available online 1995)
卷期:
Volume 78,
issue 10
页码: 6321-6323
ISSN:0021-8979
年代: 1995
DOI:10.1063/1.360512
出版商: AIP
数据来源: AIP
摘要:
Pb(Ti0.48Zr0.52)O3films produced by pulsed laser ablation deposition have been locally examined for their homogeneity and thickness through a comparative use of Raman and infrared spectroscopy. Raman scattering intensity appears to be an oscillating function of the position of the point under measurements. The observed oscillations were explained by light interference effects in the film and used to obtain the thickness profile and the refractive index dispersion of the film. The intensity distribution in Raman spectra across the film differs from that of the target. This difference is larger at the center than near the edge of the film. ©1995 American Institute of Physics.
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