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Electrical characterization of PLT thin films by LP-MOCVD

 

作者: Seaung-Suk Lee,   Ho-Gi Kim,  

 

期刊: Integrated Ferroelectrics  (Taylor Available online 1995)
卷期: Volume 11, issue 1-4  

页码: 137-144

 

ISSN:1058-4587

 

年代: 1995

 

DOI:10.1080/10584589508013586

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

La-modified lead titanate(PLT) thin films were prepared on Pt/SiO2/Si substrate by hot-wall type low pressure-metalorganic chemical vapor deposition(LP-MOCVD). The films were deposited at 500°C under the low pressure of 1000mTorr. The films were annealed at 650°C for 10min with O2ambient before top-Pt electroding. Schottky emission was observed for Pt/PLT(12)/Pt capacitor. With increasing La mole%, surface morphologies of the PLT films were improved smoothly and leakage current density decreased.

 

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