Analytical Electron Microscopy of Heterogeneous Catalysts
作者:
F. Delannay,
期刊:
Catalysis Reviews
(Taylor Available online 1980)
卷期:
Volume 22,
issue 1
页码: 141-170
ISSN:0161-4940
年代: 1980
DOI:10.1080/03602458008066531
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Conventional transmission electron microscopy (CTEM) is by now a quite well-established technique for the study of heterogeneous catalysts. It is commonly used for the determination of metallic particles shapes and size distribution on various types of carriers [1, 2]. In addition, dark field imaging and diffraction measurements (in selected area or microdiffraction mode) allows advantage to be taken of the diffraction of the electrons in order to identify the active phase on the basis of its crystal structure [3, 4].
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