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Atomic and microstructural characterization of metal impurities in synthetic diamonds

 

作者: J. Wong,   E. F. Koch,   C. I. Hejna,   M. F. Garbauskas,  

 

期刊: Journal of Applied Physics  (AIP Available online 1985)
卷期: Volume 58, issue 9  

页码: 3388-3393

 

ISSN:0021-8979

 

年代: 1985

 

DOI:10.1063/1.335755

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The phase and microstructure of Ni, Co, and Fe impurities found in synthetic diamonds have been characterized in some detail using a combination of extended x‐ray absorption fine structure (EXAFS) utilizing intense synchrotron radiation as a light source, and conventional transmission electron microscopy (TEM), x‐ray diffraction, and fluorescence analyses. In all three cases, the metal impurity exists as an fcc metallic phase dispersed in the diamond matrix. The particles are submicron in size and not facetted. There was no evidence of a metal carbide phase in these systems. Quantitative simulations of the first‐shell EXAFS signal showed that the Co and Ni particles contain, respectively, 2.3 and 1.5 at. % of carbon in solution.

 

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