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Determination of optical constants near the fundamental absorption edge in semiconductors

 

作者: S. Mil'Shtein,   A. Senderichin,   A. Ioffe,  

 

期刊: Radiation Effects and Defects in Solids  (Taylor Available online 1989)
卷期: Volume 111-112, issue 1-2  

页码: 263-272

 

ISSN:1042-0150

 

年代: 1989

 

DOI:10.1080/10420158908213001

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The photoconductivity of semiconductors was considered under the following general conditions: the surface recombination velocity was not equal to zero, the space charge near the surface is taken into account, the value of absorption coefficient was not limited. Solving both the continuity and Poisson equations for an illuminated thick specimen, we obtained a solution which suggests a new combined measurement in order to determine various optical constants. The absorption coefficient and the diffusion length of electrons in CZ grownn-type Si (Na= 1012-1013cm−3) were measured at room temperature, using the new technique.

 

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