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What electroluminescence and transient space charge limited current tell us about Staebler‐Wronski defects

 

作者: K. Wang,   D. Han,   M. Silver,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1991)
卷期: Volume 234, issue 1  

页码: 162-169

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41024

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Steady state electroluminescence depends upon radiative and non‐radiative processes often governed by recombination centers. Transient space charge limited currents also depend upon capture by these same deep states although recombination is not involved. We have studied both of these phenomena as a function of photodegradation in order to gain insight into the nature of Staebler‐Wronski defects. We have found that photodegradation primarily shortens the non‐radiative lifetime but has little effect upon the radiative lifetime. On the other hand, photodegradation seems to have a profound effect upon the transient space charge limited current. We have not yet determined whether this is a junction or a bulk effect.

 

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