Evidence for tip imaging in scanning tunneling microscopy
作者:
E. J. van Loenen,
D. Dijkkamp,
A. J. Hoeven,
J. M. Lenssinck,
J. Dieleman,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 18
页码: 1755-1757
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.103090
出版商: AIP
数据来源: AIP
摘要:
It is demonstrated that scanning tunneling microscopy (STM) images often contain three‐dimensional ghost images of the tunneling tip. These ghost images directly reflect the shape of the tip, as is proven by comparing them with tip indentations made in Si. Tip images appear as a set of identical protrusions, and have been observed regularly on Si surfaces annealed at 1200 K in ultrahigh vacuum. Imaging of rough surfaces may be fully dominated by this effect which can lead to incorrect image interpretations in STM and AFM.
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