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Optical characterization of waveguide based photonic microstructures

 

作者: Thomas F. Krauss,   Richard M. De La Rue,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 68, issue 12  

页码: 1613-1615

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.115668

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Third‐order, one‐dimensional, semiconductor‐air gratings have been designed, fabricated, and evaluated by optical waveguide transmission measurements. Gratings with as little as six unit cells show a clear band edge around 840–850 nm. Owing to our approach of semiconductor‐rich lattices with small airgaps, the diffractive spreading loss is sufficiently small (∼50% in the passband) for meaningful results to be extracted. The measurements indicate that the optical waveguide approach is a good starting point for the study of photonic microstructures and that practical device concepts can be implemented. ©1996 American Institute of Physics.

 

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