Optical characterization of waveguide based photonic microstructures
作者:
Thomas F. Krauss,
Richard M. De La Rue,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 12
页码: 1613-1615
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.115668
出版商: AIP
数据来源: AIP
摘要:
Third‐order, one‐dimensional, semiconductor‐air gratings have been designed, fabricated, and evaluated by optical waveguide transmission measurements. Gratings with as little as six unit cells show a clear band edge around 840–850 nm. Owing to our approach of semiconductor‐rich lattices with small airgaps, the diffractive spreading loss is sufficiently small (∼50% in the passband) for meaningful results to be extracted. The measurements indicate that the optical waveguide approach is a good starting point for the study of photonic microstructures and that practical device concepts can be implemented. ©1996 American Institute of Physics.
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