Etching of aluminum film by hydrogen atoms
作者:
M. Hara,
K. Domen,
T. Onishi,
H. Nozoye,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 14
页码: 1793-1795
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.106203
出版商: AIP
数据来源: AIP
摘要:
The reaction between hydrogen atoms and an ultrathin aluminum film (2 monolayer) on a Mo(111) substrate was studied by thermal desorption (TD) and Auger electron spectroscopy (AES). Through TD experiments for the hydrogen precovered aluminum films, desorption of aluminum hydride was observed at 370 K. It was confirmed that 1/3 monolayer of aluminum was desorbed as aluminum hydrides after a TD experiment for the aluminum film on which hydrogen was preadsorbed to a full monolayer coverage. The aluminum film was continuously etched at 410 K by a steady flow of hydrogen atoms. These results indicate the potential capability of hydrogen atoms as a selective etchant for aluminum.
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