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Device fabrication by ion implantation

 

作者: A.U. Mac Rae,  

 

期刊: Radiation Effects  (Taylor Available online 1971)
卷期: Volume 7, issue 1-2  

页码: 59-63

 

ISSN:0033-7579

 

年代: 1971

 

DOI:10.1080/00337577108232564

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Ion implantation of boron and phosphorus into silicon yields material that has electrical characteristics that are similar to silicon doped by conventional techniques. These results, and the ability to control and reproduce both the number of dopant atoms and their depth distribution, have been used to considerable advantage to fabricate both discrete devices and integrated circuits by ion implantation. We have made resistors, junction diodes, hyperabrupt diodes, IMPATTS, and field effect transistors. The narrow spread in the operating characteristics and the excellent performance of these devices, illustrate the advantages gained by using ion implantation as a step in the fabrication of devices.

 

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