作者: Gerhard Meyer,
期刊: Review of Scientific Instruments (AIP Available online 1996) 卷期: Volume 67, issue 8
页码: 2960-2965
ISSN:0034-6748
年代: 1996
DOI:10.1063/1.1147080
出版商: AIP
数据来源: AIP
摘要:
The design of a low‐temperature scanning tunneling microscope is described. The microscope can be operated in ultrahigh vacuum in the temperature range between 15 and 300 K. The main features are a scanner which is based on the Besocke ‘‘beetle’’ design principle combined with a spring suspension of the microscope and complete surrounding of the whole microscope by a 4 K radiation shield. The microscope can be extended to work as a force microscope using the optical lever detection technique for force measurement. It is demonstrated that this comparatively small and reliable setup is well suited to study the adsorption of single atoms and molecules at low temperatures. Moreover, examples of lateral and vertical manipulation of atoms and molecules are shown to demonstrate the performance of the system. ©1996 American Institute of Physics.
点击下载: PDF (1408KB)
返 回
版权所有 © 2009 NSTL国家科技图书文献中心
咨询热线:800-990-8900 010-58882057 Email:service@nstl.gov.cn
地址:北京市复兴路15号 100038 京ICP备05017586号