Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers
作者:
Jun Hu,
Xu‐Dong Xiao,
Miquel Salmeron,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 4
页码: 476-478
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114541
出版商: AIP
数据来源: AIP
摘要:
The atomic force microscope is used to measure dielectric polarization forces on surfaces induced by a charged tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using polarization forces we have been able to image liquid films, droplets, and other weakly adsorbed material. ©1995 American Institute of Physics.
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