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Automatized X‐Ray Line Profile Analysis

 

作者: H. Keller,   A. Segmu¨ller,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1963）
卷期: Volume 34, issue 6  

页码: 684-688

 

ISSN:0034-6748

 

年代: 1963

 

DOI:10.1063/1.1718540

 

出版商: AIP

 

数据来源: AIP

 

摘要:

X‐ray line profiles are measured fully automatically by means of a preprogrammed step scan. The intensity data are taken by means of the fixed count method and punched into paper tape by an electronic clock. The evaluation of the intensity data and the Fourier analysis of the line profiles is performed on an IBM 1620 computer.

 

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