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Very High Critical Current and Field Characteristics of Niobium Nitride Thin Films

 

作者: J. R. Gavaler,   M. A. Janocko,   A. Patterson,   C. K. Jones,  

 

期刊: Journal of Applied Physics  (AIP Available online 1971)
卷期: Volume 42, issue 1  

页码: 54-57

 

ISSN:0021-8979

 

年代: 1971

 

DOI:10.1063/1.1659649

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Previous results indicated that NbN thin films possess critical current and field characteristics significantly superior to that of bulk NbN having a similarTc. Further measurements made on NbN films, with thicknesses between 50 Å and 8 &mgr;, now show that, at 4.2°K, certain of these films exhibit the highest current densities of any presently known superconductor in all fields from zero up to the limit of our measurement capability (210 kOe). In addition, anomalously high current and field values have been measured in very thin (<300 Å) films. These thinner films show no depressions inJc(measured at 4.2°K) or inHc2(O) values despite decreases inTcfrom almost 16°K (in the thicker films) down to 11°K.

 

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