Defect Signal Enhancement in Inspection Lines by Magnetic Flux Leakage
作者:
J. Etcheverry,
A. Pignotti,
G. Sa´nchez,
P. Stickar,
期刊:
AIP Conference Proceedings
(AIP Available online 1903)
卷期:
Volume 657,
issue 1
页码: 1721-1727
ISSN:0094-243X
年代: 1903
DOI:10.1063/1.1570337
出版商: AIP
数据来源: AIP
摘要:
The detection of flaws that involve 5&percent; or more of the pipe wall thickness is not easy to achieve for internal defects inspected from the outside. In this work we focus on a relatively straightforward technique, based on obtaining the characteristic signature of relevant defects, and projecting the actual signals on these “standard” defect configurations, thus increasing the signal‐to‐noise ratio and providing an alternative way to determine the nature of the defect. Several options are discussed, including some that are computationally less demanding, and are susceptible of being implemented on‐line. © 2003 American Institute of Physics
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