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Very high breakdown voltage and large transconductance realized on GaN heterojunction field effect transistors

 

作者: Y.‐F. Wu,   B. P. Keller,   S. Keller,   D. Kapolnek,   P. Kozodoy,   S. P. Denbaars,   U. K. Mishra,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 10  

页码: 1438-1440

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117607

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report record high breakdown voltages up to 340 and 230 V realized on unintentionally doped (1.5 &mgr;m gate length) and Si doped (1 &mgr;m gate length) AlGaN/GaN modulation doped field effect transistors (MODFETs), respectively. The devices also have large transconductances up to 140 mS/mm and a full channel current of 150–400 mA/mm. The Si doped MODFET sample demonstrated a very high room temperature mobility of 1500 cm2/Vs. With these specifications, GaN field effect transistors as microwave power devices are practical. ©1996 American Institute of Physics.

 

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