A multi-sample Cs-sputter negative-ion source
作者:
G. D. Alton,
B. Cui,
Y. Bao,
C. A. Reed,
J. A. Ball,
C. Williams,
期刊:
AIP Conference Proceedings
(AIP Available online 1999)
卷期:
Volume 473,
issue 1
页码: 352-359
ISSN:0094-243X
年代: 1999
DOI:10.1063/1.58955
出版商: AIP
数据来源: AIP
摘要:
A multi-sample Cs sputter negative-ion source, equipped with a conical-geometry, W-surface-ionizer has been designed and fabricated that permits sample changes without disruption of on-line accelerator operation. Sample changing is effected by actuating an electro-pneumatic control system located at ground potential that drives an air-motor-driven sample-indexing-system mounted at high voltage; this arrangement avoids complications associated with indexing mechanisms that rely on electronic power-supplies located at high potential. In-beam targets are identified by LED indicator lights derived from a fiber-optic, Gray-code target-position sensor. Aspects of the overall source design and details of the indexing mechanism along with operational parameters, ion optics, intensities, and typical emittances for a variety of negative-ion species will be presented in this report. ©1999 American Institute of Physics.
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