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A multi-sample Cs-sputter negative-ion source

 

作者: G. D. Alton,   B. Cui,   Y. Bao,   C. A. Reed,   J. A. Ball,   C. Williams,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1999)
卷期: Volume 473, issue 1  

页码: 352-359

 

ISSN:0094-243X

 

年代: 1999

 

DOI:10.1063/1.58955

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A multi-sample Cs sputter negative-ion source, equipped with a conical-geometry, W-surface-ionizer has been designed and fabricated that permits sample changes without disruption of on-line accelerator operation. Sample changing is effected by actuating an electro-pneumatic control system located at ground potential that drives an air-motor-driven sample-indexing-system mounted at high voltage; this arrangement avoids complications associated with indexing mechanisms that rely on electronic power-supplies located at high potential. In-beam targets are identified by LED indicator lights derived from a fiber-optic, Gray-code target-position sensor. Aspects of the overall source design and details of the indexing mechanism along with operational parameters, ion optics, intensities, and typical emittances for a variety of negative-ion species will be presented in this report. ©1999 American Institute of Physics.

 

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