首页   按字顺浏览 期刊浏览 卷期浏览 Ion milled tips for scanning tunneling microscopy
Ion milled tips for scanning tunneling microscopy

 

作者: D. K. Biegelsen,   F. A. Ponce,   J. C. Tramontana,   S. M. Koch,  

 

期刊: Applied Physics Letters  （AIP Available online 1987）
卷期: Volume 50, issue 11  

页码: 696-698

 

ISSN:0003-6951

 

年代: 1987

 

DOI:10.1063/1.98070

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.

 

点击下载:  PDF (310KB)



返 回