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Sensitivity and detective quantum efficiency of electron microscope plates at high voltages

 

作者: D. G. Ast,  

 

期刊: Journal of Applied Physics  (AIP Available online 1974)
卷期: Volume 45, issue 10  

页码: 4638-4643

 

ISSN:0021-8979

 

年代: 1974

 

DOI:10.1063/1.1663103

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The voltage dependence of the electron sensitivity of photographic emulsions is analyzed in terms of experimentally established relations between (i) track density and energy loss rate (ii) incident energy and range. It is found that the latter strongly dominates the functional sensitivity at high energies. Calculated values are compared with experimental data by Dudley. The detective quantum efficiency of standard electron microscope plates is computed as a function of energy.

 

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