Calibration of atomic‐force microscope tips
作者:
Jeffrey L. Hutter,
John Bechhoefer,
期刊:
Review of Scientific Instruments
(AIP Available online 1993)
卷期:
Volume 64,
issue 7
页码: 1868-1873
ISSN:0034-6748
年代: 1993
DOI:10.1063/1.1143970
出版商: AIP
数据来源: AIP
摘要:
Images and force measurements taken by an atomic‐force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.
点击下载:
PDF
(947KB)
返 回