Evidence of quantum lateral confinement in side‐gated resonant tunnelling diodes formed by patterned substrate regrowth
作者:
M. A. Quierin,
M. P. Grimshaw,
D. A. Ritchie,
J. H. Burroughes,
M. L. Leadbeater,
M. Pepper,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 12
页码: 1702-1704
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.115911
出版商: AIP
数据来源: AIP
摘要:
MBE regrowth on patternednp‐GaAs wafers has been used to fabricate GaAs/AlGaAs double barrier resonant tunnel diodes with a side‐gate in the plane of the quantum well. The physical diameters vary from 1 to 20 &mgr;m. For a nominally 1 &mgr;m diameter diode the peak current is reduced by more than 95% at a side‐gate voltage of −2 V at 1.5 K, which we estimate corresponds to an active tunnel region diameter of 75 nm ± 10 nm. At high gate biases additional structure appears in the conductance data. DifferentialI‐Vmeasurements show a linear dependence of the spacing of subsidiary peaks on gate bias indicating lateral quantum confinement. ©1996 American Institute of Physics.
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