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Evidence of quantum lateral confinement in side‐gated resonant tunnelling diodes formed by patterned substrate regrowth

 

作者: M. A. Quierin,   M. P. Grimshaw,   D. A. Ritchie,   J. H. Burroughes,   M. L. Leadbeater,   M. Pepper,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 68, issue 12  

页码: 1702-1704

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.115911

 

出版商: AIP

 

数据来源: AIP

 

摘要:

MBE regrowth on patternednp‐GaAs wafers has been used to fabricate GaAs/AlGaAs double barrier resonant tunnel diodes with a side‐gate in the plane of the quantum well. The physical diameters vary from 1 to 20 &mgr;m. For a nominally 1 &mgr;m diameter diode the peak current is reduced by more than 95% at a side‐gate voltage of −2 V at 1.5 K, which we estimate corresponds to an active tunnel region diameter of 75 nm ± 10 nm. At high gate biases additional structure appears in the conductance data. DifferentialI‐Vmeasurements show a linear dependence of the spacing of subsidiary peaks on gate bias indicating lateral quantum confinement. ©1996 American Institute of Physics.

 

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