Photothermal radiometry of infrared translucent materials
作者:
S. Paoloni,
H. G. Walther,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 1
页码: 101-106
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365789
出版商: AIP
数据来源: AIP
摘要:
SiC layers on silicon have been investigated by photothermal radiometry to study the influence of infrared emission spectra on the photothermal signal behavior. This was done by placing different band pass filters in front of the infrared detector. Because of the small amplitude of the obtained infrared signal, background contributions must be eliminated. A technique to correct the data with respect to background is presented and experimentally tested. ©1997 American Institute of Physics.
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