首页   按字顺浏览 期刊浏览 卷期浏览 Epitaxial YBa2Cu3O7−&dgr; /BaxSr1−xTiO3heterostructures on silicon&h...
Epitaxial YBa2Cu3O7−&dgr; /BaxSr1−xTiO3heterostructures on silicon‐on‐sapphire for tunable microwave components

 

作者: Yu. A. Boikov,   Z. G. Ivanov,   A. N. Kiselev,   E. Olsson,   T. Claeson,  

 

期刊: Journal of Applied Physics  (AIP Available online 1995)
卷期: Volume 78, issue 7  

页码: 4591-4595

 

ISSN:0021-8979

 

年代: 1995

 

DOI:10.1063/1.359804

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Epitaxial trilayer heterostructures of YBa2Cu3O7−&dgr;/BaxSr1−xTiO3/YBa2Cu3O7−&dgr;were grown on silicon‐on‐sapphire buffered by a double layer of CeO2/Y–ZrO2. Such structures may be considered for tunable microwave filters. The top and bottom YBa2Cu3O7−&dgr;films were wellc‐axis oriented, free from microcracks and had superconducting transitionsTc’s in the range 86–90 K. A thin antidiffusion layer of SrTiO3(d≊70 A˚) between YBa2Cu3O7−&dgr;and BaxSr1−xTiO3(x=0.25–0.9) promoted better crystallinity and higherTcof the top superconducting film. An Ag/BaxSr1−xTiO3/YBa2Cu3O7−&dgr;capacitor structure was used to determine the dielectric permittivity and the high frequency loss tan &dgr; of the BaxSr1−xTiO3layer. Maximum values of the permittivity of the BaxSr1−xTiO3layers were observed around the Curie temperatures of corresponding bulk monocrystals. The dielectric permittivity of the BaxSr1−xTiO3(x=0.25–0.75) layers depended strongly (≊20%) on an applied voltage (±2.5 V) at temperatures around 77 K. The tan &dgr; was much higher in films than in bulk crystals. ©1995 American Institute of Physics.

 

点击下载:  PDF (732KB)



返 回