X‐ray Fraunhofer diffraction patterns from a thin‐film waveguide
作者:
Y. P. Feng,
S. K. Sinha,
Eric E. Fullerton,
G. Gru¨bel,
D. Abernathy,
D. P. Siddons,
J. B. Hastings,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 24
页码: 3647-3649
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115346
出版商: AIP
数据来源: AIP
摘要:
We have observed the Fraunhofer diffraction pattern of x‐rays exiting from the end face of a SiO2/polyimide/Si thin‐film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x‐ray beam may be used as a source for coherence‐based experiments, such as x‐ray photon correlation spectroscopy. ©1995 American Institute of Physics.
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