Conducting atomic force microscopy of alkane layers on graphite
作者:
David L. Klein,
Paul L. McEuen,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 19
页码: 2478-2480
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114001
出版商: AIP
数据来源: AIP
摘要:
We have used an atomic force microscope with a conducting tip to investigate the layering of hexadecane on graphite. Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to higher force scales than have been previously achieved, and can be used to determine when the tip makes contact with the substrate. The layering also enables the formation of stable tunneling junctions. ©1995 American Institute of Physics.
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