On the Determination of Single Sampling Attribute Plans Based upon a Linear Cost Model and a Prior Distribution
作者:
WilliamC. Guenther,
期刊:
Technometrics
(Taylor Available online 1971)
卷期:
Volume 13,
issue 3
页码: 483-498
ISSN:0040-1706
年代: 1971
DOI:10.1080/00401706.1971.10488813
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The linear cost model previously formalized by Hald [4], [5], [9] is reviewed. Techniques are described which permit easy determination of sampling plans based on that model. The degenerate, the beta, and the two point distributions are considered as prior distributions ofp, the process fraction defective. For calculations only standard tables and a desk calculator are required.
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