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On the Determination of Single Sampling Attribute Plans Based upon a Linear Cost Model and a Prior Distribution

 

作者: WilliamC. Guenther,  

 

期刊: Technometrics  (Taylor Available online 1971)
卷期: Volume 13, issue 3  

页码: 483-498

 

ISSN:0040-1706

 

年代: 1971

 

DOI:10.1080/00401706.1971.10488813

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The linear cost model previously formalized by Hald [4], [5], [9] is reviewed. Techniques are described which permit easy determination of sampling plans based on that model. The degenerate, the beta, and the two point distributions are considered as prior distributions ofp, the process fraction defective. For calculations only standard tables and a desk calculator are required.

 

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