When the surface of a solid is bombarded with ions a fraction of the primary energy is reemitted by ion reflection and sputtering. The contribution of ion reflection or sputtering to energy reflection is determined by the mass ratio of the bombarding ions to the target atoms.1,2In the case of light ions the contribution of reflected ions is dominant. Results for He+and Ne+bombardment were described in a previous paper.3The present paper deals with results for Ar+, Kr+, and Xe+bombardment of the same targets as investigated before.3The energies of the mass selected bombarding ions range from 9 to 16 keV. The measurements were carried out by means of the thermic detector described in a separate paper.4For the given mass ratios most of the reemitted energy is related to sputtering.