Anomalous fatigue behavior in Zn doped PZT
作者:
B.M. Melnick,
M.C. Scott,
C.A. Paz De Araujo,
L.D. McMillan,
T. Mihara,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1993)
卷期:
Volume 3,
issue 4
页码: 293-300
ISSN:1058-4587
年代: 1993
DOI:10.1080/10584589308216684
出版商: Taylor & Francis Group
关键词: PZT;Zn;Hf;Nb;doping
数据来源: Taylor
摘要:
Doping lead zirconate titanate (PZT) has often been examined in order to investigate changes in the electrical behavior of thin film ferroelectric capacitors.1In this study, PZT has been doped with Hf, Nb, and Zn. After reviewing the results of the initial studies, Zn doping of PZT was further investigated. Physical and electrical studies of Zn doped PZT have been conducted. These studies include x-ray diffraction analysis, hysteresis, pulsed switching, fatigue and retention measurements. Endurance measurements indicate an anomalous fatigue behavior of some Zn doped PZT thin film capacitors.
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