Effects of temperature and impurities on electron radiation damage in the high voltage microscope
作者:
M.S. Spring,
M. Ipohorski,
M.J. Goringe,
期刊:
Radiation Effects
(Taylor Available online 1971)
卷期:
Volume 11,
issue 3-4
页码: 251-259
ISSN:0033-7579
年代: 1971
DOI:10.1080/00337577108231111
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
This paper describes the results of irradiation of specimens of copper and copper containing up to 2 at % beryllium in the high-voltage electron microscope. The results of irradiation at temperatures ranging from 20–500 K are described and discussed in the light of recently proposed theories of defect nucleation. Although the results are difficult to interpret because of the many diverse factors which influence the nucleation and growth of the damage it was found that the values for the volume density of defects were in general agreement with the predictions, if the effects of the foil surfaces were taken into account.
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