Edge effects in photorefractive thin films
作者:
Qingnan Wang,
Apriel K. Hodari,
Doyle A. Temple,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 2
页码: 545-549
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.364197
出版商: AIP
数据来源: AIP
摘要:
We have used a two-dimensional charge transport model to study edge effects in photorefractive thin films. Our result shows the presence of a large surface charge layer that causes saturation of trap-limited-field in the large fringe spacing limit. Quadratic electro-optic materials were used as an example to quantitatively study the contribution of the surface-charge-layer field to the total photorefractive grating. We clearly demonstrate that the device performance can be dominated by either surface charge or bulk trap charges. ©1997 American Institute of Physics.
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