High resolution imaging of thin-film recording heads by superparamagnetic magnetic force microscopy tips
作者:
S. H. Liou,
S. S. Malhotra,
John Moreland,
P. F. Hopkins,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 1
页码: 135-137
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119286
出版商: AIP
数据来源: AIP
摘要:
We have used superparamagnetic magnetic force microscopy (MFM) tips to obtain high spatial resolution MFM images of recording heads. Profiles of the magnetic field gradient above a thin-film recording head under 3 mA bias current to the head and various tip-head distance conditions are presented. At a low tip-head distance, the gap width, gap location, and gap-field structure can be well resolved in these MFM images. Superparamagnetic tips show promise for the magnetic imaging of recording heads with gap widths below 200 nm. ©1997 American Institute of Physics.
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