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High resolution imaging of thin-film recording heads by superparamagnetic magnetic force microscopy tips

 

作者: S. H. Liou,   S. S. Malhotra,   John Moreland,   P. F. Hopkins,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 1  

页码: 135-137

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119286

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have used superparamagnetic magnetic force microscopy (MFM) tips to obtain high spatial resolution MFM images of recording heads. Profiles of the magnetic field gradient above a thin-film recording head under 3 mA bias current to the head and various tip-head distance conditions are presented. At a low tip-head distance, the gap width, gap location, and gap-field structure can be well resolved in these MFM images. Superparamagnetic tips show promise for the magnetic imaging of recording heads with gap widths below 200 nm. ©1997 American Institute of Physics.

 

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