Through the use of an image ground plane, measurements of scattering patterns for objects with at least one plane of symmetry have been made. Until recently, only the magnitude of the patterns were available. Now the system's capability has been expanded to include accurate phase information. The system makes use of bistatic measurements and is interfaced with a MINC-11 minicomputer which provides fast and efficient automation of the measurement process as well as data analysis capability. The scattering range is operated using a microwave X-band system.