Temperature dependence of a high-Tcsingle-flux-quantum logic gate up to 50 K
作者:
Kazuo Saitoh,
Tadashi Utagawa,
Youichi Enomoto,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 21
页码: 2754-2756
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.121080
出版商: AIP
数据来源: AIP
摘要:
Basic characteristics of a simple single-flux-quantum (SFQ) logic gate using high-Tcmaterial and Josephson junction (NdBa2Cu3O7−&dgr;and focused ion beam junction) have been investigated. The logic gate consists of an rf-superconducting quantum interference device (rf-SQUID) and a dc-SQUID. In the logic gate, elementary SFQ logic operations, such as generating SFQ (dc/SFQ) and providing simultaneous readout (SFQ/dc), have been confirmed up to 50 K. The temperature dependencies of the output voltage level and the critical current-normal resistance(IcRn)product were compared, and the decreasing tendency of the output voltage level for increasing temperature was found to be more rapid than that of theIcRnproduct. ©1998 American Institute of Physics.
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