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Temperature dependence of a high-Tcsingle-flux-quantum logic gate up to 50 K

 

作者: Kazuo Saitoh,   Tadashi Utagawa,   Youichi Enomoto,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 21  

页码: 2754-2756

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.121080

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Basic characteristics of a simple single-flux-quantum (SFQ) logic gate using high-Tcmaterial and Josephson junction (NdBa2Cu3O7−&dgr;and focused ion beam junction) have been investigated. The logic gate consists of an rf-superconducting quantum interference device (rf-SQUID) and a dc-SQUID. In the logic gate, elementary SFQ logic operations, such as generating SFQ (dc/SFQ) and providing simultaneous readout (SFQ/dc), have been confirmed up to 50 K. The temperature dependencies of the output voltage level and the critical current-normal resistance(IcRn)product were compared, and the decreasing tendency of the output voltage level for increasing temperature was found to be more rapid than that of theIcRnproduct. ©1998 American Institute of Physics.

 

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