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High‐precision refractive index measurements revealing order parameter fluctuations in KMnF3and NiO

 

作者: F. J. Scha¨fer,   W. Kleemann,  

 

期刊: Journal of Applied Physics  (AIP Available online 1985)
卷期: Volume 57, issue 7  

页码: 2606-2612

 

ISSN:0021-8979

 

年代: 1985

 

DOI:10.1063/1.335451

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The temperature dependence of the refractive indexnof cubic crystals undergoing phase transitions (PT) is measured with an accuracy of the order &dgr;n=10−6at temperatures between 3.5 and 1000 K with a computer‐controlled Jamin–Lebedeff interferometer. Microscopic monitoring forinsitusample orientation and single domain work is provided. Results are presented for KMnF3(antiferrodistortive PT) and NiO (antiferromagnetic PT) and discussed within the framework of a generalized phenomenological indicatrix perturbation theory. It predicts the proportionality between the order parameter autocorrelation function ⟨&dgr;&eegr;2⟩ and the refractive index anomaly preceding the PT. Comparison with recent theoretical predictions is performed.

 

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