High‐precision refractive index measurements revealing order parameter fluctuations in KMnF3and NiO
作者:
F. J. Scha¨fer,
W. Kleemann,
期刊:
Journal of Applied Physics
(AIP Available online 1985)
卷期:
Volume 57,
issue 7
页码: 2606-2612
ISSN:0021-8979
年代: 1985
DOI:10.1063/1.335451
出版商: AIP
数据来源: AIP
摘要:
The temperature dependence of the refractive indexnof cubic crystals undergoing phase transitions (PT) is measured with an accuracy of the order &dgr;n=10−6at temperatures between 3.5 and 1000 K with a computer‐controlled Jamin–Lebedeff interferometer. Microscopic monitoring forinsitusample orientation and single domain work is provided. Results are presented for KMnF3(antiferrodistortive PT) and NiO (antiferromagnetic PT) and discussed within the framework of a generalized phenomenological indicatrix perturbation theory. It predicts the proportionality between the order parameter autocorrelation function 〈&dgr;&eegr;2〉 and the refractive index anomaly preceding the PT. Comparison with recent theoretical predictions is performed.
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