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High‐resolution third‐sound resonator

 

作者: F. M. Ellis,   R. B. Hallock,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1983）
卷期: Volume 54, issue 6  

页码: 751-753

 

ISSN:0034-6748

 

年代: 1983

 

DOI:10.1063/1.1137468

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A third‐sound helium film resonator using a capacitive thickness detector suitable for high‐resolution studies of third sound in4He and3He–4He mixtures is described. The sensitivity to changes in the helium film thickness is observed to be &bartil;0.1 pm.

 

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