Measurement system induced errors in diode thermometry
作者:
John K. Krause,
Brad C. Dodrill,
期刊:
Review of Scientific Instruments
(AIP Available online 1986)
卷期:
Volume 57,
issue 4
页码: 661-665
ISSN:0034-6748
年代: 1986
DOI:10.1063/1.1138886
出版商: AIP
数据来源: AIP
摘要:
Diode temperature sensors are capable of being used at the accuracy level of a few hundredths of a kelvin. However, in order to achieve this performance, proper measurement techniques must be used. Poorly shielded or improperly grounded measurement systems can introduce ac noise which will create an apparent shift in the dc voltage reading across a diode sensor. This results in a temperature measurement error which may approach several tenths of a kelvin. The presence of the ac noise in question is not obvious during normal usage and several quick tests are outlined to verify whether or not a noise problem exists. Experimental data and derivations from theoreticalp‐njunction characteristics are given which correlate the ac noise level with possible voltage/temperature measurement errors. These results can be used in estimating the accuracy and performance of a temperature measurement system. Several of the more common problems which introduce noise into diode circuitry are described.
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