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Self‐developing photoetching of organic films by near UV radiation

 

作者: H. Franke,  

 

期刊: Applied Physics Letters  (AIP Available online 1984)
卷期: Volume 45, issue 1  

页码: 110-112

 

ISSN:0003-6951

 

年代: 1984

 

DOI:10.1063/1.95006

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Thin films of a photosensitive material based on polymethyl methacrylate have been fabricated on glass substrates. By illumination with light of a photoresist illuminator (300–450 nm) the material can be etched out in the illuminated areas. Film thicknessdchanges from, e.g., 12 to 4 &mgr;m after 20‐min illumination. Simultaneously the refractive indexndecreases by 2×10−2. Additional annealing treatment causes little further development ofnanddpatterns. Spatial resolution is limited by lithographic technique and is smaller than 1 &mgr;m.

 

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