Common Pitfalls in Evoked Potential Technology
作者:
YarworthSandy,
期刊:
American Journal of EEG Technology
(Taylor Available online 1987)
卷期:
Volume 27,
issue 3
页码: 161-167
ISSN:0002-9238
年代: 1987
DOI:10.1080/00029238.1987.11080228
出版商: Taylor&Francis
关键词: Artifact;BAEP;EP;pattern reversal;SSEP;VEP;wave-form
数据来源: Taylor
摘要:
ABSTRACT.If after running the standard evoked potential (EP) test on a patient, you notice that the waveforms and the latencies do not resemble those of your norms, nor do they fit the expected outcome for a patient with a particular set of clinical problems, then you must question the technical quality of the test. It is the responsibility of the technologist to obtain the most accurate and reproducible results possible and it is to this end that these practical hints have been collected.
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