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Common Pitfalls in Evoked Potential Technology

 

作者: YarworthSandy,  

 

期刊: American Journal of EEG Technology  (Taylor Available online 1987)
卷期: Volume 27, issue 3  

页码: 161-167

 

ISSN:0002-9238

 

年代: 1987

 

DOI:10.1080/00029238.1987.11080228

 

出版商: Taylor&Francis

 

关键词: Artifact;BAEP;EP;pattern reversal;SSEP;VEP;wave-form

 

数据来源: Taylor

 

摘要:

ABSTRACT.If after running the standard evoked potential (EP) test on a patient, you notice that the waveforms and the latencies do not resemble those of your norms, nor do they fit the expected outcome for a patient with a particular set of clinical problems, then you must question the technical quality of the test. It is the responsibility of the technologist to obtain the most accurate and reproducible results possible and it is to this end that these practical hints have been collected.

 

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