Electron depletion due to bias of a T‐shaped field‐effect transistor
作者:
G. A. Georgakis,
Qian Niu,
期刊:
Journal of Applied Physics
(AIP Available online 1995)
卷期:
Volume 78,
issue 2
页码: 640-646
ISSN:0021-8979
年代: 1995
DOI:10.1063/1.360323
出版商: AIP
数据来源: AIP
摘要:
A T‐shaped field‐effect transistor, made out of a pair of two‐dimensional electron gases, is modeled and studied. A simple numerical model is developed to study the electron distribution versus applied gate voltage for different gate lengths. The model is then improved to account for depletion and the width of the two‐dimensional electron gases. The results are then compared to the experimental ones and to some approximate analytical calculations and are found to be in good agreement with them. ©1995 American Institute of Physics.
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