Characterization of reorientation of a thin layer of ferroelectric liquid‐crystal material under an applied field by excitation of optical modes
作者:
S. J. Elston,
J. R. Sambles,
期刊:
Applied Physics Letters
(AIP Available online 1989)
卷期:
Volume 55,
issue 16
页码: 1621-1623
ISSN:0003-6951
年代: 1989
DOI:10.1063/1.102217
出版商: AIP
数据来源: AIP
摘要:
The director configuration in a thin layer of ferroelectric liquid crystal (FLC) under an applied static field is investigated by exciting optic modes in a FLC cell. The reflectivity data obtained may only be fitted to theory by maintaining in the voltage‐distorted optical tensor profile a point in the middle of the cell having the same structure as at 0 V. This unambiguously confirms the chevron structure observed in x‐ray diffraction and shows that the layering remains largely undistorted to fields of order 3×106V m−1.
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