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Characterization of reorientation of a thin layer of ferroelectric liquid‐crystal material under an applied field by excitation of optical modes

 

作者: S. J. Elston,   J. R. Sambles,  

 

期刊: Applied Physics Letters  (AIP Available online 1989)
卷期: Volume 55, issue 16  

页码: 1621-1623

 

ISSN:0003-6951

 

年代: 1989

 

DOI:10.1063/1.102217

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The director configuration in a thin layer of ferroelectric liquid crystal (FLC) under an applied static field is investigated by exciting optic modes in a FLC cell. The reflectivity data obtained may only be fitted to theory by maintaining in the voltage‐distorted optical tensor profile a point in the middle of the cell having the same structure as at 0 V. This unambiguously confirms the chevron structure observed in x‐ray diffraction and shows that the layering remains largely undistorted to fields of order 3×106V m−1.

 

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