首页   按字顺浏览 期刊浏览 卷期浏览 Conservation and filling of neutral hole traps in SiO2during ionizing radiation exposure
Conservation and filling of neutral hole traps in SiO2during ionizing radiation exposure

 

作者: L. Lipkin,   A. Reisman,   C. K. Williams,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 57, issue 21  

页码: 2237-2238

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.104162

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The question of whether ionizing radiation creates fixed positive charge and/or neutral hole traps, or simply fills existing neutral hole traps has been examined by equating the density of intrinsic neutral hole traps, present before irradiation, with the sum of fixed positive charge and the remaining neutral hole traps present after x‐ray irradiation. The total number of positive Coulombic and neutral hole traps was found to remain constant, regardless of the level of radiation the device receives. This indicates strongly that fixed positive charge represents filled intrinsic hole traps and that additional hole trapping defects, except for a small amount of fixed negative charge, are not generated by ionizing radiation in the photon energy range studied.

 

点击下载:  PDF (244KB)



返 回