Extraction of spectral hemispherical reflectance (albedo) of surfaces from nadir and directional reflectance data
作者:
D. S. KIMES,
P. J. SELLERS,
D. J. DINER,
期刊:
International Journal of Remote Sensing
(Taylor Available online 1987)
卷期:
Volume 8,
issue 12
页码: 1727-1746
ISSN:0143-1161
年代: 1987
DOI:10.1080/01431168708954813
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
A radiative transfer model was used to explore how the error in inferring spectral hemispherical reflectance (pλ) from nadir reflectance values varies as a function of wavelength, solar zenith angle, leaf area index and leaf orientation distribution. Secondly, a technique using multiple spectral nadir reflectance values to inferpλfor a single wavelength was tested using field data. In addition, several techniques that use multiple off-nadir view angles taken in azimuth planes (calledstringsof data) were tested using field data. These latter techniques were very accurate (with errors less than 4 percent of the true value)and are ideally suited to present and future sensor systems that scan in a known azimuth plane (e.g. Advanced Very High Resolution Radiometer (AVHRR) and other scanning radiometers) or view fore and aft in a known azimuth plane (e.g. Advanced Solid-State Array Sensor (ASAS)Moderate Resolution Imaging Spectrometer (MODIS)High Resolution Imaging Spectrometer (HIRIS)), a brief analysis was performed to explore the effects of errors in hemispherical reflectance on terrestrial energy budget and productivity calculations.
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