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Extraction of spectral hemispherical reflectance (albedo) of surfaces from nadir and directional reflectance data

 

作者: D. S. KIMES,   P. J. SELLERS,   D. J. DINER,  

 

期刊: International Journal of Remote Sensing  (Taylor Available online 1987)
卷期: Volume 8, issue 12  

页码: 1727-1746

 

ISSN:0143-1161

 

年代: 1987

 

DOI:10.1080/01431168708954813

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

A radiative transfer model was used to explore how the error in inferring spectral hemispherical reflectance (pλ) from nadir reflectance values varies as a function of wavelength, solar zenith angle, leaf area index and leaf orientation distribution. Secondly, a technique using multiple spectral nadir reflectance values to inferpλfor a single wavelength was tested using field data. In addition, several techniques that use multiple off-nadir view angles taken in azimuth planes (calledstringsof data) were tested using field data. These latter techniques were very accurate (with errors less than 4 percent of the true value)and are ideally suited to present and future sensor systems that scan in a known azimuth plane (e.g. Advanced Very High Resolution Radiometer (AVHRR) and other scanning radiometers) or view fore and aft in a known azimuth plane (e.g. Advanced Solid-State Array Sensor (ASAS)Moderate Resolution Imaging Spectrometer (MODIS)High Resolution Imaging Spectrometer (HIRIS)), a brief analysis was performed to explore the effects of errors in hemispherical reflectance on terrestrial energy budget and productivity calculations.

 

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