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Origin of the Microwave Loss in Ultra‐Low Linewidth Substituted Garnets

 

作者: Carl E. Pattern,   H. J. Van Hook,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1972)
卷期: Volume 5, issue 1  

页码: 1565-1568

 

ISSN:0094-243X

 

年代: 1972

 

DOI:10.1063/1.2953914

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Linewidth measurements from 77–300°K and room temperature off‐resonance effective linewidth data at 9 GHz show that the microwave losses in ultra‐low‐loss Ca&sngbnd;V&sngbnd;In substituted YIG and Ca‐Ge‐In‐YIG are completely resolvable in terms of known processes and that only a small part of the loss is due to anisotropy broadening. For the lowest linewidth of 2 Oe observed to date (Ca‐Ge‐In‐YG), about 0. 5 Oe is due to rare earth impurities 0. 9 Oe is from porosity broadening, and 0. 2 Oe is from anisotropy. The remaining 0.4 Oe contribution is comparable to expected “intrinsic” single crystal linewidths.

 

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