Origin of the Microwave Loss in Ultra‐Low Linewidth Substituted Garnets
作者:
Carl E. Pattern,
H. J. Van Hook,
期刊:
AIP Conference Proceedings
(AIP Available online 1972)
卷期:
Volume 5,
issue 1
页码: 1565-1568
ISSN:0094-243X
年代: 1972
DOI:10.1063/1.2953914
出版商: AIP
数据来源: AIP
摘要:
Linewidth measurements from 77–300°K and room temperature off‐resonance effective linewidth data at 9 GHz show that the microwave losses in ultra‐low‐loss Ca&sngbnd;V&sngbnd;In substituted YIG and Ca‐Ge‐In‐YIG are completely resolvable in terms of known processes and that only a small part of the loss is due to anisotropy broadening. For the lowest linewidth of 2 Oe observed to date (Ca‐Ge‐In‐YG), about 0. 5 Oe is due to rare earth impurities 0. 9 Oe is from porosity broadening, and 0. 2 Oe is from anisotropy. The remaining 0.4 Oe contribution is comparable to expected “intrinsic” single crystal linewidths.
点击下载:
PDF
(166KB)
返 回