Measuring Retention of Chromated Copper Arsenate in Conifer Sapwood by Direct-Scan X-Ray Techniques
作者:
SusanM. Smith,
JeffreyJ. Morrell,
JerroldE. Winandy,
期刊:
Journal of Wood Chemistry and Technology
(Taylor Available online 1990)
卷期:
Volume 10,
issue 1
页码: 21-38
ISSN:0277-3813
年代: 1990
DOI:10.1080/02773819008050225
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
This study was designed to indicate how well direct-scan X-raying predicts preservative retention and distribution of chromated copper arsenate (CCA) in wafers of conifer sapwood. The intensity of X-rays passed through western hemlock wafers treated with varying concentrations of CCA solutions was inversely proportional to preservative concentration. X-ray intensities predicted 98% of the variation in preservative retention among the wafers. Intensity of direct-scan X-rays passed through selected test materials was consistent over a 9-month span. X-ray intensity over 1000 readings at a single scan point had a coefficient of variation of 0.1%. The strong relationship between direct-scan X-ray intensity and preservative retention, as well as the repeatability of intensity readings over time and the small variation in intensity readings at each data point, indicate that direct-scan X-ray techniques can be used to assess preservative retention and distribution in wood treated with inorganic arsenicals such as CCA.
点击下载:
PDF (573KB)
返 回