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Tungsten deposition on GaAs using WF6and atomic hydrogen

 

作者: A. J. P. van Maaren,   W. C. Sinke,  

 

期刊: Journal of Applied Physics  (AIP Available online 1993)
卷期: Volume 73, issue 4  

页码: 1989-1992

 

ISSN:0021-8979

 

年代: 1993

 

DOI:10.1063/1.353164

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Tungsten was deposited on GaAs employing WF6as precursor gas. A comparison is made between molecular and atomic hydrogen as reducing agent. Atomic hydrogen is producedinsituby dissociating molecular hydrogen on a hot (2100 °C) filament. Tungsten deposition was not observed only when molecular hydrogen and the substrate were available as reducing agents. Introduction of atomic hydrogen did lead to W deposition on GaAs.

 

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