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pLayers on Vacuum Heated Silicon

 

作者: F. G. Allen,   T. M. Buck,   J. T. Law,  

 

期刊: Journal of Applied Physics  (AIP Available online 1960)
卷期: Volume 31, issue 6  

页码: 979-985

 

ISSN:0021-8979

 

年代: 1960

 

DOI:10.1063/1.1735787

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It has been established that when silicon is heated above 1300°K in a borosilicate glass vacuum system from 1011to 1015acceptors per cm2are normally added to the silicon surface, even though the glass walls remain at room temperature. The acceptor diffuses into the surface upon heating forming aplayer several microns deep.There is strong evidence that the acceptor is boron from the borosilicate glass envelope. The transfer to the silicon is believed to occur through volatilization of boron oxides by water vapor.

 

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