Influence of thermal annealing on the photoluminescence from pseudomorphicSi1−yCyepilayers on Si
作者:
C. Penn,
S. Zerlauth,
J. Stangl,
G. Bauer,
G. Brunthaler,
F. Scha¨ffler,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 15
页码: 2172-2174
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119372
出版商: AIP
数据来源: AIP
摘要:
Near band edge photoluminescence (PL) is observed from about 100-nm-thick pseudomorphicSi1−yCyepilayers, which were grown by molecular beam epitaxy on a Si substrate. Different pieces of one wafer were annealed at temperatures between 500 and 800 °C, and it is shown that annealing leads to increased PL intensities and reduced linewidths. The smallest achieved full width at half maximum was 8.6 meV. We also observe a blueshift of the PL lines after annealing, which does not correspond to the minor changes in the amount of substitutional carbon deduced from x-ray measurements. Temperature dependent PL measurements suggest that the recombination involves electrons localized at alloy fluctuations. ©1997 American Institute of Physics.
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