首页   按字顺浏览 期刊浏览 卷期浏览 Optical characterization of GaN films by photoreflectance and photocurrent measurement
Optical characterization of GaN films by photoreflectance and photocurrent measurement

 

作者: L. H. Qin,   Y. D. Zheng,   D. Feng,   Z. C. Huang,   J. C. Chen,  

 

期刊: Journal of Applied Physics  (AIP Available online 1995)
卷期: Volume 78, issue 12  

页码: 7424-7426

 

ISSN:0021-8979

 

年代: 1995

 

DOI:10.1063/1.360400

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on the room temperature optical characterization of single crystal hexagonal GaN films on (0001) sapphire grown by metalorganic chemical vapor deposition. The energy gap of GaN was determined to be 3.400 eV by photoreflectance and the possible origin of the photoreflectance signal is discussed. Photocurrent measurement exhibited a peak at 3.351 eV and a continued photoresponse through the ultraviolet region. We found that the intensity of photocurrent was dependent upon the chopper frequency in the measurement. Absorption coefficient and film thickness were obtained from the optical transmission spectra. ©1995 American Institute of Physics.

 

点击下载:  PDF (312KB)



返 回